KLA Corporation, a leading provider of process control and yield management solutions, partners with customers around the world to develop state-of-the-art inspection and metrology technologies. These technologies serve the semiconductor, data storage, LED, and other related nanoelectronics industries. With a portfolio of industry-standard products and a team of world-class engineers and scientists, the company has created superior solutions for its customers for more than 35 years. Headquartered in Milpitas, Calif., KLA has dedicated customer operations and service centers around the world. Additional information may be found at www.kla-tencor.com.
With over 40 years of semiconductor process control experience, chipmakers around the globe rely on KLA to ensure that their fabs ramp next-generation devices to volume production quickly and cost-effectively. Enabling the movement towards advanced chip design, KLA's Global Products Group (GPG), which is responsible for creating all of KLA’s metrology and inspection products, is looking for the best and the brightest research scientist, software engineers, application development engineers, and senior product technology process engineers.
First to deliver the best imaging and classification data for every defect or point on any layer at any time.
EBeam’s mission encapsulates its role as the “eyes” of KLA’s product line, providing timely information on defects and critical locations on the wafer at the highest spatial resolution possible. Customers use EBeam products alongside KLA patterned and bare wafer inspectors to quickly understand the nature of defects and other imperfections on product wafers and take action to correct the manufacturing process.
This position involves developing prototype analog circuitry, including simulations, schematics, PCBA layout, building prototype PCBA, bench debug test, etc.
Equal Employment Opportunity
KLA is an Equal Opportunity Employer. Applicants will be considered for employment without regard to age, race, color, religion, sex, sexual orientation, gender identity, national origin, protected veteran status, disability, or any other characteristics protected by applicable law.