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KLA Corporation, a leading provider of process control and yield management solutions, partners with customers around the world to develop state-of-the-art inspection and metrology technologies. These technologies serve the semiconductor, data storage, LED, and other related nanoelectronics industries. With a portfolio of industry-standard products and a team of world-class engineers and scientists, the company has created superior solutions for its customers for more than 35 years. Headquartered in Milpitas, Calif., KLA has dedicated customer operations and service centers around the world. Additional information may be found at www.kla-tencor.com.
The LS-SWIFT (Laser Scan & Simultaneous Wafer Inspection at Fast Throughput) division is part of the Wafer Inspection Group (WIG) and consists in an organization globally located in US, India, and Singapore.
The LS-SWIFT division has the mission to provide cost-effective solutions for high-sampling wafer inspection applications. We effectively partner with field support teams and customers to lower overall fab costs by supplying world-leading high-throughput inspection, metrology and review systems. Our comprehensive product portfolio includes: all-wafer-surface (frontside, backside, and edge) macro inspection, laser scanning tools, standalone high-sampling inspection, and standalone edge inspection and metrology tools that are deployed across several advanced wafer fabs for a large number of applications.
Besides developing valuable products, the LS-SWIFT division provides support to the customers to achieve performance entitlement through the sharing and implementation of applications BKM (Best Known Methods).
Knowledge of KLA specific or general semiconductor domain, FA prefered